Machine Learning to Shorten Diagnostic Odysseys in Critically Ill Neonates Admitted to Level IV NICUs
Sunday, May 5, 2024
8:15 AM – 8:30 AM ET
Location: Metro Toronto Convention Centre: 204
CE Enduring CME: 0.25
Publication Number: 2450.2
Bimal P.. Chaudhari, Nationwide Children's Hospital, Columbus, OH, United States; Austin A. Antoniou, Nationwide Children's Hospital, Columbus, OH, United States; Regan McGinley, Nationwide Children's Hospital, Columbus, OH, United States; Marina Metzler, Washington University in St. Louis School of Medicine, St Louis, MO, United States
Presenting Author(s)
Bimal P. Chaudhari, MD, MPH (he/him/his)
Assistant Professor of Pediatrics Nationwide Children's Hospital Columbus, Ohio, United States
